BaS & ECE April 2015 - page 17

April 2015
17
T
OOLS
& S
OFTWARE
manual counting of 0s and 1s. In some pro-
tocols like CAN or LIN, it decodes the data
to more human-friendly symbols beyond the
HEX, ASCII, or binary decode. An arbitrary
waveform generator (AWG) is another pop-
ular instrument integrated into scopes these
days as stimulus and response testing o en
augments troubleshooting scenarios. In the
case of the In niiVision 3000T X-Series AWG,
it also comes with a waveformmodulation fea-
ture as well as a popular on-screen waveform
editing tool. Finally, this scope series provides
an optional 8-digit counter with the totalizer
leveraging it, a 1.6 ppm ultra-stable timebase,
and a 3-digit digital volt meter, all very handy
tools for everyday problem-solving tasks. e
time-correlation of analog, digital, and fre-
quency domain signals is an emerging trou-
bleshooting method in digital designs which
integrate RF interfaces. Fortunately, oscillo-
scopes o en come with a frequency domain
analysis feature called Fast Fourier Transform
(FFT). However, this usually provides one-di-
mensional analysis rather than three. With the
standard time-gated FFT feature of the new
scopes, you can quickly time-correlate analog,
digital, and frequency domain phenomena in
a single display, providing more insights into
the design. Knowing exactly how long it took
for the signal to hop from one frequency to
another a er a speci c digital command may
be the key data for troubleshooting. Demand
more instruments and multi-domain integra-
tion in your next scope!
Don’t forget that the latest general-purpose
portable scopes come with powerful so ware
and probes beyond traditional scopes, some
standard and some optional. For example,
let’s look into power-related measurements. It
is said that many power analysis measurement
errors are due to human errors like incorrect
setups. With optional automated power anal-
ysis so ware on the 3000T X-Series, you are
setup error-free, giving you the best chance
of evaluating power design most e ciently.
Additionally, the scopes support an ultra-low
current measurement probe to address the
troubleshooting of the emerging battery oper-
ational devices, and a power rail probe to view
the most precise details of power integrity
design challenges.
e Keysight BenchVue so ware (free) and the
N8900 In niiumO ine Oscilloscope Analysis
so ware (optional) are two examples where the
so ware solutions open up new possibilities
for oscilloscope utilisation. For example, you
can control, capture, and log measurements
from multiple instruments, like oscilloscopes,
simultaneously with the innovative Keysight
BenchVue, even if you are sitting away from
the instruments, perhaps in your home o ce.
e In niium O ine Oscilloscope Analysis
so ware allows analyzing captured data o ine,
potentially using more powerful analysis fea-
tures than are available on a scope. If you sim-
ply want a full remote control of the scope, as
if you were sitting in front of it, just connect
to the scope via LAN from your PC or tab-
let device to change settings, save data, and/
or capture screenshots. e new In niiVision
3000T X-Series supports all the mentioned fea-
tures. Demand more so ware solutions from
your next scope!
„
Figure 2. With Zone Touch Trigger, you can draw a box around the signal of interest, select must
or must not intersect, and then the scope triggers and isolates it.
Figure 3. With the standard time-gated FFT feature, you can quickly time-correlate analog,
digital, and frequency domain phenomena in a single display.
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